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"Dynamic Scan: Driving Down the Cost of Test."

Samitha Samaranayake et al. (2002)

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DOI: 10.1109/MC.2002.1039519

access: closed

type: Journal Article

metadata version: 2020-08-12

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  - https://dblp.org/rec/journals/computer/SamaranayakeSKAW02
Samitha Samaranayake, Nodari Sitchinava, Rohit Kapur, Minesh B. Amin, Thomas W. Williams:
Dynamic Scan: Driving Down the Cost of Test. Computer 35(10): 63-68 (2002)

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