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"Novel electrical characterization for advanced CMOS gate dielectrics."

T. P. Ma (2008)

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DOI: 10.1007/S11432-008-0068-3

access: closed

type: Journal Article

metadata version: 2020-05-18

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T. P. Ma:
Novel electrical characterization for advanced CMOS gate dielectrics. Sci. China Ser. F Inf. Sci. 51(6): 774-779 (2008)

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