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"Defect characterization of amorphous silicon thin film solar cell based on ..."

Linna Hu et al. (2018)

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DOI: 10.1007/S11432-017-9360-7

access: closed

type: Journal Article

metadata version: 2023-09-04

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  - https://dblp.org/rec/journals/chinaf/HuHCJHMGQ18
Linna Hu, Liang He, Hua Chen, Xiaofei Jia, Ying Hu, Hongmei Ma, Dandan Guo, Yu Qin:
Defect characterization of amorphous silicon thin film solar cell based on low frequency noise. Sci. China Inf. Sci. 61(6): 069403:1-069403:3 (2018)

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