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"Bug Localization for Version Issues With Defect Patterns."

Xiaobing Sun et al. (2019)

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DOI: 10.1109/ACCESS.2019.2894976

access: open

type: Journal Article

metadata version: 2021-12-14

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  dblp key:
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  - https://dblp.org/rec/journals/access/SunZLNL19
Xiaobing Sun, Wei Zhou, Bin Li, Zhen Ni, Jinting Lu:
Bug Localization for Version Issues With Defect Patterns. IEEE Access 7: 18811-18820 (2019)

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