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"An Investigation of Electric Field and Breakdown Voltage Models for a Deep ..."

Tao Liu et al. (2019)

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DOI: 10.1109/ACCESS.2019.2944991

access: open

type: Journal Article

metadata version: 2020-01-30

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  - https://dblp.org/rec/journals/access/LiuHWGLWGH19
Tao Liu, Shengdong Hu, Jian-an Wang, Gang Guo, Jun Luo, Yuan Wang, Jingwei Guo, Yanmeng Huo:
An Investigation of Electric Field and Breakdown Voltage Models for a Deep Trench Superjunction SiC VDMOS. IEEE Access 7: 145118-145123 (2019)

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