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"Indium Tin Oxide Film Characterization at 0.1-20 GHz Using Coaxial Probe ..."

Elias A. Alwan, Asimina Kiourti, John L. Volakis (2015)

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DOI: 10.1109/ACCESS.2015.2433062

access: open

type: Journal Article

metadata version: 2018-07-04

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Elias A. Alwan, Asimina Kiourti, John L. Volakis:
Indium Tin Oxide Film Characterization at 0.1-20 GHz Using Coaxial Probe Method. IEEE Access 3: 648-652 (2015)

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