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"Write-through method for embedded memory with compression Scan-based testing."

Geewhun Seok, Hong Kim, Baker Mohammad (2012)

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DOI: 10.1109/VTS.2012.6231096

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-05

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  dblp key:
  - conf/vts/SeokKM12
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  - https://dblp.org/rec/conf/vts/SeokKM12
Geewhun Seok, Hong Kim, Baker Mohammad:
Write-through method for embedded memory with compression Scan-based testing. VTS 2012: 158-163

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