"A built-in self-test technique for load inductance and lossless current ..."

Tao Liu et al. (2014)

Details and statistics

DOI: 10.1109/VTS.2014.6818750

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

a service of  Schloss Dagstuhl - Leibniz Center for Informatics