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ORCID"31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May ..."
- 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. IEEE Computer Society 2013, ISBN 978-1-4673-5542-1 [contents]
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