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"Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects ..."

Felipe Lavratti et al. (2015)

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DOI: 10.1109/VLSID.2015.74

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Felipe Lavratti, Letícia Maria Bolzani Poehls, Fabian Vargas, Andrea Calimera, Enrico Macii:
Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs. VLSID 2015: 405-410

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