"3D IC test scheduling using simulated annealing."

Chih-Yao Hsu et al. (2012)

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DOI: 10.1109/VLSI-DAT.2012.6212659

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Chih-Yao Hsu, Chun-Yi Kuo, James Chien-Mo Li, Krishnendu Chakrabarty:
3D IC test scheduling using simulated annealing. VLSI-DAT 2012: 1-4

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