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"Area and reliability efficient ECC scheme for 3D RAMs."

Li-Jung Chang, Yu-Jen Huang, Jin-Fu Li (2012)

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DOI: 10.1109/VLSI-DAT.2012.6212645

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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  - conf/vlsi-dat/ChangHL12
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  - https://dblp.org/rec/conf/vlsi-dat/ChangHL12
Li-Jung Chang, Yu-Jen Huang, Jin-Fu Li:
Area and reliability efficient ECC scheme for 3D RAMs. VLSI-DAT 2012: 1-4

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