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"Cross-Entropy: A New Metric for Software Defect Prediction."

Xian Zhang, Kerong Ben, Jie Zeng (2018)

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DOI: 10.1109/QRS.2018.00025

access: closed

type: Conference or Workshop Paper

metadata version: 2018-08-08

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  dblp key:
  - conf/qrs/ZhangBZ18
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  - https://dblp.org/rec/conf/qrs/ZhangBZ18
Xian Zhang, Kerong Ben, Jie Zeng:
Cross-Entropy: A New Metric for Software Defect Prediction. QRS 2018: 111-122

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