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ORCID"Diagnosing Silicon Failures Based on Functional Test Patterns."
Chia-Chih Yen et al. (2006)
- Chia-Chih Yen, Ten Lin, Hermes Lin, Kai Yang, Ta-Yung Liu, Yu-Chin Hsu:
Diagnosing Silicon Failures Based on Functional Test Patterns. MTV 2006: 94-98
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