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"Defect-Location Identification for Cell-Aware Test."

Zhan Gao et al. (2019)

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DOI: 10.1109/LATW.2019.8704561

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
  - conf/latw/GaoMMSHG19
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  - https://dblp.org/rec/conf/latw/GaoMMSHG19
Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken, Kees Goossens:
Defect-Location Identification for Cell-Aware Test. LATS 2019: 1-6

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