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"Test Pattern Generation for Analog Circuits Using Neural Networks and ..."

José Luis Bernier et al. (1995)

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DOI: 10.1007/3-540-59497-3_258

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-08

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  dblp key:
  - conf/iwann/BernierMOP95
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José Luis Bernier, Juan Julián Merelo Guervós, Julio Ortega, Alberto Prieto:
Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms. IWANN 1995: 838-844

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