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"Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing ..."
Stephen K. Sunter, Benoit Nadeau-Dostie (2002)
- Stephen K. Sunter, Benoit Nadeau-Dostie:
Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost. ITC 2002: 446-455
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