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"Testability evaluation of sequential designs incorporating the multi-mode ..."

Adit D. Singh et al. (1999)

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DOI: 10.1109/TEST.1999.805642

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  - https://dblp.org/rec/conf/itc/SinghSGS99
Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring:
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC 1999: 286-293

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