"The effects of test compaction on fault diagnosis."

Yun Shao et al. (1999)

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DOI: 10.1109/TEST.1999.805842

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Yun Shao, Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
The effects of test compaction on fault diagnosis. ITC 1999: 1083-1089

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