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"Built-in self-test for GHz embedded SRAMs using flexible pattern generator ..."

Shigeru Nakahara et al. (1999)

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DOI: 10.1109/TEST.1999.805644

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/NakaharaHKKK99
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  persistent URL:
  - https://dblp.org/rec/conf/itc/NakaharaHKKK99
Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani:
Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. ITC 1999: 301-310

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