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"A deterministic BIST scheme based on EDT-compressed test patterns."

Grzegorz Mrugalski et al. (2015)

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DOI: 10.1109/TEST.2015.7342398

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-22

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  dblp key:
  - conf/itc/MrugalskiRRST15
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  - https://dblp.org/rec/conf/itc/MrugalskiRRST15
Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer:
A deterministic BIST scheme based on EDT-compressed test patterns. ITC 2015: 1-8

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