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"Accelerated Compact Test Set Generation for Three-State Circuits."
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor (1996)
- M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor:
Accelerated Compact Test Set Generation for Three-State Circuits. ITC 1996: 29-38
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