"Adaptive test selection for post-silicon timing validation: A data mining ..."

Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng (2012)

Details and statistics

DOI: 10.1109/TEST.2012.6401540

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics