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"High Quality Test Methodology for Highly Reliable Devices."

Hao Chen et al. (2019)

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DOI: 10.1109/ITC44170.2019.9000174

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-26

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  dblp key:
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  - https://dblp.org/rec/conf/itc/ChenLCW19
Hao Chen, Mincent Lee, Liang-Yen Chen, Min-Jer Wang:
High Quality Test Methodology for Highly Reliable Devices. ITC 2019: 1-6

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