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"High Frequency Wafer Probing and Power Supply Resonance Effects."

S. P. Athan, David C. Keezer, J. McKinley (1991)

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DOI: 10.1109/TEST.1991.519776

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/itc/AthanKM91
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  - https://dblp.org/rec/conf/itc/AthanKM91
S. P. Athan, David C. Keezer, J. McKinley:
High Frequency Wafer Probing and Power Supply Resonance Effects. ITC 1991: 1069-1078

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