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"Cell-aware test generation time reduction by using switch-level ATPG."

Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen (2017)

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DOI: 10.1109/ITC-ASIA.2017.8097105

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen:
Cell-aware test generation time reduction by using switch-level ATPG. ITC-Asia 2017: 27-32

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