"On Screening Reliability Using Lithographic Process Corner Information ..."

Vikram B. Suresh, Priyamvada Vijayakumar, Sandip Kundu (2011)

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DOI: 10.1109/ISVLSI.2011.66

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Vikram B. Suresh, Priyamvada Vijayakumar, Sandip Kundu:
On Screening Reliability Using Lithographic Process Corner Information Gleaned from Tester Measurements. ISVLSI 2011: 248-253

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