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"Measurements and modeling of intrinsic fluctuations in MOSFET threshold ..."

Ali Keshavarzi et al. (2005)

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DOI: 10.1145/1077603.1077611

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/islped/KeshavarziSTMBTZLHDBD05
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  - https://dblp.org/rec/conf/islped/KeshavarziSTMBTZLHDBD05
Ali Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De:
Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. ISLPED 2005: 26-29

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