"Characterization of an LVDS Link in 28 nm CMOS for Multi-Purpose Pattern ..."

Gianluca Traversi et al. (2018)

Details and statistics

DOI: 10.1109/ISCAS.2018.8351576

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

a service of  Schloss Dagstuhl - Leibniz Center for Informatics