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"Power noise in 14, 10, and 7 nm FinFET CMOS technologies."

Ravi Patel, Eby G. Friedman, Praveen Raghavan (2016)

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DOI: 10.1109/ISCAS.2016.7527164

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-07

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Ravi Patel, Eby G. Friedman, Praveen Raghavan:
Power noise in 14, 10, and 7 nm FinFET CMOS technologies. ISCAS 2016: 37-40

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