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"Impact of package on neutron induced single event upset in 20 nm SRAM."

Taiki Uemura et al. (2015)

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DOI: 10.1109/IRPS.2015.7112828

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  dblp key:
  - conf/irps/UemuraKMH15
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  - https://dblp.org/rec/conf/irps/UemuraKMH15
Taiki Uemura, Takashi Kato, Hideya Matsuyama, Masanori Hashimoto:
Impact of package on neutron induced single event upset in 20 nm SRAM. IRPS 2015: 9

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