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"Wafer Level Approach for the Investigation of the Long-Term Stability of ..."

Timo Schossler et al. (2019)

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DOI: 10.1109/IRPS.2019.8720464

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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  dblp key:
  - conf/irps/SchosslerSLU19
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Timo Schossler, Florian Schon, Christian Lemier, Gerald Urban:
Wafer Level Approach for the Investigation of the Long-Term Stability of Resistive Platinum Devices at Elevated Temperatures. IRPS 2019: 1-5

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