"In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs ..."

Yiming Qu et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129591

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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Yiming Qu, Jiwu Lu, Junkang Li, Zhuo Chen, Jie Zhang, Chunlong Li, Shiuh-Wuu Lee, Yi Zhao:
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation. IRPS 2020: 1-6

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