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"Impact of slow and fast oxide traps on In0.53Ga0.47As device operation ..."
Vamsi Putcha et al. (2018)
- Vamsi Putcha, Jacopo Franco, Abhitosh Vais, Ben Kaczer, S. Sioncke, Dimitri Linten, Guido Groeseneken:
Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps. IRPS 2018: 5
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