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"Investigation of the data retention mechanism and modeling for the high ..."
Yoshiyuki Kawashima, Takashi Hashimoto, Ichiro Yamakawa (2015)
- Yoshiyuki Kawashima, Takashi Hashimoto, Ichiro Yamakawa:
Investigation of the data retention mechanism and modeling for the high reliability embedded split-gate MONOS flash memory. IRPS 2015: 6
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