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"Reliability Analysis of a Delay-Locked Loop Under HCI and BTI Degradation."

Tonmoy Dhar, Sachin S. Sapatnekar (2019)

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DOI: 10.1109/IRPS.2019.8720447

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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  dblp key:
  - conf/irps/DharS19
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  - https://dblp.org/rec/conf/irps/DharS19
Tonmoy Dhar, Sachin S. Sapatnekar:
Reliability Analysis of a Delay-Locked Loop Under HCI and BTI Degradation. IRPS 2019: 1-6

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