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"Naive Bayes Multi-Label Classification Approach for High-Voltage Condition ..."

Imene Mitiche et al. (2018)

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DOI: 10.1109/IOTAIS.2018.8600914

access: closed

type: Conference or Workshop Paper

metadata version: 2019-02-05

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  dblp key:
  - conf/iotais/MiticheNBSM18
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Imene Mitiche, Alan Nesbitt, Philip Boreham, Brian G. Stewart, Gordon Morison:
Naive Bayes Multi-Label Classification Approach for High-Voltage Condition Monitoring. IOTAIS 2018: 162-166

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