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"A methodology for measuring transistor ageing effects towards accurate ..."

Elie Maricau, Georges G. E. Gielen (2009)

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DOI: 10.1109/IOLTS.2009.5195978

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/iolts/MaricauG09
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  persistent URL:
  - https://dblp.org/rec/conf/iolts/MaricauG09
Elie Maricau, Georges G. E. Gielen:
A methodology for measuring transistor ageing effects towards accurate reliability simulation. IOLTS 2009: 21-26

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