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"A Diagnostic Reasoning Approach to Defect Prediction."

Rui Abreu, Alberto González-Sanchez, Arjan J. C. van Gemund (2011)

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DOI: 10.1007/978-3-642-21827-9_43

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-01

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  dblp key:
  - conf/ieaaie/AbreuGG11
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  - https://dblp.org/rec/conf/ieaaie/AbreuGG11
Rui Abreu, Alberto González-Sanchez, Arjan J. C. van Gemund:
A Diagnostic Reasoning Approach to Defect Prediction. IEA/AIE (2) 2011: 416-425

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