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"Multiple fault testing in systems-on-chip with high-level decision diagrams."

Raimund Ubar et al. (2015)

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DOI: 10.1109/IDT.2015.7396738

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Raimund Ubar, Stephen Adeboye Oyeniran, Mario Schölzel, Heinrich Theodor Vierhaus:
Multiple fault testing in systems-on-chip with high-level decision diagrams. IDT 2015: 66-71

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