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"Impacts of single trap induced random telegraph noise on Si and Ge ..."

Shao-Yu Yang et al. (2013)

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DOI: 10.1109/ICICDT.2013.6563303

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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  - conf/icicdt/YangCFHSC13
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  - https://dblp.org/rec/conf/icicdt/YangCFHSC13
Shao-Yu Yang, Yin-Nien Chen, Ming-Long Fan, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang:
Impacts of single trap induced random telegraph noise on Si and Ge nanowire FETs, 6T SRAM cells and logic circuits. ICICDT 2013: 61-64

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