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"Improvement of gate disturb degradation in SONOS FETs for Vth mismatch ..."

Masamichi Suzuki, Atsuhiro Kinoshita, Yuichiro Mitani (2013)

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DOI: 10.1109/ICICDT.2013.6563335

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Masamichi Suzuki, Atsuhiro Kinoshita, Yuichiro Mitani:
Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits. ICICDT 2013: 195-198

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