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"Variability analysis of a 28nm near-threshold synchronous voltage converter."

Temesghen Tekeste et al. (2013)

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DOI: 10.1109/ICECS.2013.6815516

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-15

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  - conf/icecsys/TekesteSBE13
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Temesghen Tekeste, Ayman Shabra, Duane S. Boning, Ibrahim M. Elfadel:
Variability analysis of a 28nm near-threshold synchronous voltage converter. ICECS 2013: 723-726

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