"A New RF SiCMOS SDD Model for Quantifying Individual Contribution to ..."

Ali Abuelmaatti, Iain Thayne (2006)

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DOI: 10.1109/ICECS.2006.379667

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Ali Abuelmaatti, Iain Thayne:
A New RF SiCMOS SDD Model for Quantifying Individual Contribution to Distortion from Transistor's Nonlinear Parameters. ICECS 2006: 5-8

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