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"Development of Hierarchical Testability Design Methodologies for ..."

Cheng-Ping Wang, Chin-Long Wey (1997)

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DOI: 10.1109/ICCD.1997.628910

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Cheng-Ping Wang, Chin-Long Wey:
Development of Hierarchical Testability Design Methodologies for Analog/Mixed-Signal Integrated Circuits. ICCD 1997: 468-473

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