"Analysis of reliability of flip-flops under transistor aging effects in ..."

Vikram G. Rao, Hamid Mahmoodi (2011)

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DOI: 10.1109/ICCD.2011.6081439

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Vikram G. Rao, Hamid Mahmoodi:
Analysis of reliability of flip-flops under transistor aging effects in nano-scale CMOS technology. ICCD 2011: 439-440

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