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"Automatic test case generation using multi-protocol test method."

Soo-In Lee et al. (2000)

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DOI: 10.1109/ICCCN.2000.885515

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-05

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Soo-In Lee, Yongbum Park, Myungchul Kim, Hee Yong Youn, Ben Lee:
Automatic test case generation using multi-protocol test method. ICCCN 2000: 360-366

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