"Functional test generation for delay faults in combinational circuits."

Irith Pomeranz, Sudhakar M. Reddy (1995)

Details and statistics

DOI: 10.1109/ICCAD.1995.480204

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics