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"Best of both worlds: integration of split manufacturing and camouflaging ..."

Satwik Patnaik et al. (2018)

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DOI: 10.1145/3240765.3240784

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Satwik Patnaik, Mohammed Ashraf, Ozgur Sinanoglu, Johann Knechtel:
Best of both worlds: integration of split manufacturing and camouflaging into a security-driven CAD flow for 3D ICs. ICCAD 2018: 8

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