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"HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting ..."

Yixin Luo et al. (2018)

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DOI: 10.1109/HPCA.2018.00050

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/hpca/LuoGCHM18
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  persistent URL:
  - https://dblp.org/rec/conf/hpca/LuoGCHM18
Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting Self-Recovery and Temperature Awareness. HPCA 2018: 504-517

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